发明名称 Ferroelectric transistor and memory cell configuration with the ferroelectric transistor
摘要 A first source-drain region, a channel region, and a second source-drain region are arranged one after another in a semiconductor substrate. At least the surface of the channel region and parts of the first source-drain region are covered by a dielectric layer. A ferroelectric layer is disposed on the surface of the dielectric layer between two polarization electrodes. A gate electrode is arranged on the surface of the dielectric layer. The thickness of the dielectric layer is dimensioned such that a remanent polarization of the ferroelectric layer, which is aligned between the two polarization electrodes, produces compensation charges in part of the channel region. The ferroelectric transistor is suitable as a memory cell for a memory cell configuration.
申请公布号 US2002117702(A1) 申请公布日期 2002.08.29
申请号 US20020113418 申请日期 2002.04.01
申请人 STENGL REINHARD;REISINGER HANS;HANEDER THOMAS;BACHHOFER HARALD 发明人 STENGL REINHARD;REISINGER HANS;HANEDER THOMAS;BACHHOFER HARALD
分类号 H01L21/8247;H01L21/8246;H01L27/105;H01L29/51;H01L29/78;H01L29/788;H01L29/792;(IPC1-7):H01L29/76;H01L29/94 主分类号 H01L21/8247
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