发明名称 プラズマ処理装置
摘要 PROBLEM TO BE SOLVED: To freely and finely control plasma density distribution while sufficiently restraining wavelength effect inside an RF antenna in an inductively-coupled plasma processing device.SOLUTION: An annular RF antenna 54 for generating inductively-coupling plasma in a chamber 10 is provided on a ceiling of the chamber 10 or on a dielectric window 52. The RF antenna 54 comprises two coil segments 84(1) and 84(2) spacially formed into an arc-shape of a semi-circle, and electrically and parallely connected to a high frequency power feeding part 62. Furthermore, an annular floating coil 60 with a variable capacitor 58 that can be coupled with the RF antenna 54 by electromagnetic induction is also provided on the dielectric window 52. The variable capacitor 58 can arbitrarily vary in a constant range by a variable capacitance part 82 under control of a main control part 80.
申请公布号 JP6053881(B2) 申请公布日期 2016.12.27
申请号 JP20150141133 申请日期 2015.07.15
申请人 東京エレクトロン株式会社 发明人 山澤 陽平
分类号 H01L21/3065;H01L21/31;H05H1/46 主分类号 H01L21/3065
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