发明名称 |
Method for driving nonvolatile semiconductor memory device |
摘要 |
In erasing operation, a main bit line discharge signal CPO is set at a voltage of Vss so as for a main bit line discharge transistor CP to put a main bit line BL in a floating state. A substrate signal is set at Vds to charge a local bit line LBL to Vds. A drain select gate signal DSG is set at Vleg (<(Vds+Vth)) which makes a half-conducting state between the main bit line BL and the local bit line LBL. Thereby, the main bit line BL is charged to Vmbl (=Vleg-Vth(ST)) which lowers potential differences between a drain and a source of the select transistor ST and between a drain and a source of the main bit line discharge transistor CP.
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申请公布号 |
US2003007389(A1) |
申请公布日期 |
2003.01.09 |
申请号 |
US20020147321 |
申请日期 |
2002.05.17 |
申请人 |
SHARP KABUSHIKI KAISHA |
发明人 |
OHTANI SHIGEHIRO;YAMANO KANAME |
分类号 |
G11C16/02;G11C16/06;G11C16/14;G11C16/24;(IPC1-7):G11C11/34 |
主分类号 |
G11C16/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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