| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device in which contact can be checked accurately. SOLUTION: This device is provided with an IF transistor T1, in which an external terminal 1a is connected with the drain, an external terminal 3 is connected with the gate, and a ground is connected with the source, and an IF transistor T2 in which an external terminal 2a is connected with the drain, an external terminal 4 is connected with a gate 4, and a ground is connected with the source. A test device is also provided so that a contact can be accurately checked, even if the external terminals 1a and 2a are short- circuited.
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