Driver for integrated circuit chip tester

摘要

A driver circuit for use on an integrated circuit tester. In one embodiment, the driver circuit has a timing circuit and a driver. The timing circuit has two or more inputs to receive data signals at a first frequency and at least one output. The timing circuit generates a control signal having a second higher frequency and outputs signals based on the data signals and the control signal such that the output signals are independent of the effects of timing skew and timing jitter of the data signals. The driver has at least one input coupled to the at least one output of the timing circuit to receive the output signals and couple the output signals to a device under test.