发明名称 ELECTROOPTIC PANEL AND ITS INSPECTING METHOD, AND ELECTRONIC EQUIPMENT
摘要 PROBLEM TO BE SOLVED: To provide an electrooptic panel and its inspecting method and electronic equipment which make it possible to accurately and easily position probe terminals and wiring terminals and perform electric characteristic inspection at low cost. SOLUTION: The electrooptic panel has a 1st substrate 300 where a plurality of scanning lines 312 are formed, a 2nd substrate 200 which face the 1st substrate 300 at a specific interval and has a plurality of data lines 212 crossing the scanning lines 312 to form pixels, and an electrooptic substance which is provided in the gap between the 1st substrate 300 and 2nd substrate 200. Wiring terminals 240 and 250 of the data lines 212 and scanning lines 312 are arrayed together on one side of the substrate 200 while forming groups G1, G2, and G3. The group G3 of the wiring terminals 250 of the data lines 212 and the groups G1 and G2 of the wiring terminals 240 of the scanning lines 312 are arranged at an interval S which is large enough to array the plurality of wiring terminals.
申请公布号 JP2003066870(A) 申请公布日期 2003.03.05
申请号 JP20010254845 申请日期 2001.08.24
申请人 SEIKO EPSON CORP 发明人 TANAKA SHIGEKAZU
分类号 G01R1/073;G01R31/00;G02F1/13;G02F1/1345;G09F9/00;G09F9/30;G09F9/35;H01L27/32;H01L51/50;H05B33/06;H05B33/14;(IPC1-7):G09F9/30;G02F1/134 主分类号 G01R1/073
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