发明名称 RELAY DEVICE AND IC TESTER USING IT
摘要 PROBLEM TO BE SOLVED: To provide a relay device with a favorable high frequency characteristic and an IC tester using it by using an inexpensive relay. SOLUTION: This invention is improved on a relay device passing a signal including a high frequency component through a relay. It is characterized by that it is provided with a printed circuit board connected with a conductive plane and the relay and provided with a strip line or a microstrip line having a particular impedance to the conductive plane, and a conductive plate attached to the printed circuit board in a neighborhood of a signal path of a relay interior and electrically connected with the conductive plane.
申请公布号 JP2003066100(A) 申请公布日期 2003.03.05
申请号 JP20010260883 申请日期 2001.08.30
申请人 YOKOGAWA ELECTRIC CORP 发明人 NARUKAWA KENICHI
分类号 G01R31/28;(IPC1-7):G01R31/28 主分类号 G01R31/28
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