CONTACT PROBE AND MANUFACTURING METHOD FOR IT

摘要

PROBLEM TO BE SOLVED: To provide a contact probe having versatility, and capable of reducing the manufacturing process and number of days and labor to lower the cost. SOLUTION: A contact pin 21 is formed by alternately arranging parallel pattern wiring parts 22 to 24 and non-parallel pattern wiring parts 25 to 27 along the direction toward the tip. In each of the parallel pattern wiring parts 22 to 24, pattern wirings are formed parallel to each other at designated pitches extending toward the front part. The respective non-parallel pattern wiring parts 25 to 27 are extended from the rear end parts of the parallel pattern wiring parts 22 to 24 toward the base end parts of the films 4 to be increased in space and separated from each other. Each parallel pattern wiring part 22 to 24 and each non-parallel pattern wiring part 25 to 27 are partitioned by a dividing line 28 orthogonal to the extending direction of each pattern wiring in the respective parallel pattern wiring parts 22 to 24.