发明名称 METHOD FOR MEASURING FLUORESCENCE ON SUBMICRON-SCALE GRAIN SURFACE
摘要 PROBLEM TO BE SOLVED: To provide a method for measuring fluorescence on submicron-scale grain surfaces, simple but high in detection accuracy. SOLUTION: The method for use in measuring fluorescence in a suspension of submicron-scale grains retaining a fluorescent substance is characterized in that a difference that is great enough to avoid the effect of scattering is provided between the excitation light wavelength and the fluorescence wave length for the detection of fluorescence.
申请公布号 JP2003083893(A) 申请公布日期 2003.03.19
申请号 JP20010281059 申请日期 2001.09.17
申请人 MATSUNAGA TADASHI 发明人 MATSUNAGA TADASHI;NAKAYAMA HIDEKI
分类号 G01N21/64;(IPC1-7):G01N21/64 主分类号 G01N21/64
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