发明名称 |
METHOD FOR MEASURING FLUORESCENCE ON SUBMICRON-SCALE GRAIN SURFACE |
摘要 |
PROBLEM TO BE SOLVED: To provide a method for measuring fluorescence on submicron-scale grain surfaces, simple but high in detection accuracy. SOLUTION: The method for use in measuring fluorescence in a suspension of submicron-scale grains retaining a fluorescent substance is characterized in that a difference that is great enough to avoid the effect of scattering is provided between the excitation light wavelength and the fluorescence wave length for the detection of fluorescence.
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申请公布号 |
JP2003083893(A) |
申请公布日期 |
2003.03.19 |
申请号 |
JP20010281059 |
申请日期 |
2001.09.17 |
申请人 |
MATSUNAGA TADASHI |
发明人 |
MATSUNAGA TADASHI;NAKAYAMA HIDEKI |
分类号 |
G01N21/64;(IPC1-7):G01N21/64 |
主分类号 |
G01N21/64 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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