| 摘要 |
PROBLEM TO BE SOLVED: To provide a test apparatus for semiconductor integrated circuit and test pattern diagnostic method capable of shortening the time required for the search for cause in the event of an abnormality such as frequency of fails during a test by allowing the diagnosis of only a test pattern. SOLUTION: A test pattern storage part 32 stores the test pattern to be supplied to a semiconductor integrated circuit as an object to be tested. A command retrieval part 21 and a test timing retrieval part 22 retrieve a specified command included in the test pattern stored in the test pattern storage part 32, and determine the time interval between the retrieved commands. An output device 40 displays the time interval retrieved by the command retrieval part 21 and test timing retrieval part 22.
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