| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor-testing apparatus for generating a pulse (application waveform or the like) at a different period without using a number of timing memories for storing a timing set to a DUT having a plurality of ports of a different period (frequency). SOLUTION: The semiconductor-testing apparatus that is requested to generate a timing edge pulse of a period M that is different from a period N that is the testing period of the semiconductor-testing apparatus has a period- converting means for generating a timing edge pulse of a period M that is different from a period N of a test rate without applying a specific number of plurality of timing sets that the semiconductor-testing apparatus has.
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