发明名称 METHOD FOR FORMING THIN FILM BY CHEMICAL VAPOR DEPOSITION
摘要 PROBLEM TO BE SOLVED: To provide a method for forming a thin film by chemical vapor deposition, which prevents erosion of a substrate, reduces a leakage current, and improves flatness of the film surface. SOLUTION: In a process for forming the thin film on a substrate of a semiconductor device having a step part by the chemical vapor deposition method, the thin-film forming method by the chemical vapor deposition is characterized by introducing alternately a raw gas and a reactive gas onto the above substrate of the semiconductor device, and conducting the chemical vapor deposition on it, and forming the thin film having the required film thickness on the above substrate of the semiconductor device, through repeating the above chemical vapor deposition. COPYRIGHT: (C)2003,JPO
申请公布号 JP2003160867(A) 申请公布日期 2003.06.06
申请号 JP20020313148 申请日期 2002.10.28
申请人 TOKYO ELECTRON LTD 发明人 IZUMI HIROHIKO
分类号 C23C16/44;H01L21/285;(IPC1-7):C23C16/44 主分类号 C23C16/44
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