发明名称 High performance III-nitride power device
摘要 A III-nitride semiconductor device which includes a barrier body between the gate electrode and the gate dielectric thereof.
申请公布号 US9472626(B2) 申请公布日期 2016.10.18
申请号 US201514615080 申请日期 2015.02.05
申请人 Infineon Technologies Americas Corp. 发明人 Beach Robert;He Zhi;Cao Jianjun
分类号 H01L29/20;H01L21/02;H01L21/285;H01L29/49;H01L29/778;H01L29/772;H01L29/205;H01L29/40 主分类号 H01L29/20
代理机构 Murphy, Bilak & Homiller, PLLC 代理人 Murphy, Bilak & Homiller, PLLC
主权项 1. A III-nitride power semiconductor device comprising: a III-nitride heterojunction; a substrate supporting said heterojunction, said substrate being selected from the group consisting of silicon, SiC, a III-nitride semiconductor, and sapphire; a gate insulation body over said heterojunction; a barrier body over said gate insulation body, said barrier body being selected from the group consisting of Ta, W, Si, Mo, Cr, Co, Pd, TiSiN, TaN, TaSiN, WN, WSiN, and WBN; a gate body over said barrier body, said gate body and said barrier body forming a gate electrode; first and second electrodes coupled to said heterojunction; a field insulation body disposed between said first electrode and said gate electrode; and a portion of said first electrode overlying said field insulation body.
地址 El Segundo CA US