发明名称 Resist composition
摘要 A resist composition showing excellent close adherence at the interface of a substrate and a resist, improving problems in wet etching, having excellent sensitivity and resolution, and also showing excellent resist performances, and comprising a compound of the general formula (I): wherein, R1 and R2 represent each independently a hydrogen atom or an alkyl group, R3 represents a hydrogen atom, alkyl group, aryl group, aralkyl group, alkenyl group, alkylcarbonyl group, arylcarbonyl group or aralkylcarbonyl group, n represents an integer of 1 to 40, m represents an integer of 1 to 5, and l represents an integer of 1 to 5, is provided.
申请公布号 US2003119957(A1) 申请公布日期 2003.06.26
申请号 US20020228190 申请日期 2002.08.27
申请人 KIM SANG TAE;KANG SEUNG JIN;SUNG SHI JIN;SUETSUGU MASUMI;YAMADA AIRI 发明人 KIM SANG TAE;KANG SEUNG JIN;SUNG SHI JIN;SUETSUGU MASUMI;YAMADA AIRI
分类号 G03F7/039;C08K5/00;(IPC1-7):C08K5/10 主分类号 G03F7/039
代理机构 代理人
主权项
地址