发明名称 |
Cascoded semiconductor devices |
摘要 |
A cascoded power semiconductor circuit has a clamp circuit between the source and gate of a gallium nitride or silicon carbide FET to provide avalanche protection for the cascode MOSFET transistor. |
申请公布号 |
US9472549(B2) |
申请公布日期 |
2016.10.18 |
申请号 |
US201314056648 |
申请日期 |
2013.10.17 |
申请人 |
NXP B.V. |
发明人 |
Rose Matthias;Sonsky Jan;Rutter Philip |
分类号 |
H01H47/00;H01L27/088;H01L27/08;H03K17/567;H03K17/687;H03K17/74 |
主分类号 |
H01H47/00 |
代理机构 |
|
代理人 |
|
主权项 |
1. A cascode transistor circuit comprising:
a gallium nitride field effect transistor or a silicon carbide field effect transistor having its drain connected to a high power rail and its gate directly connected to a low power rail; a silicon MOSFET with its drain connected to the source of the gallium nitride or silicon carbide FET and its source (SM) directly connected to the low power rail; and a clamp circuit that includes a diode connected between the source and gate of the gallium nitride or silicon carbide FET and that is configured to shunt current in a forward bias mode to clamp a voltage across the drain and source of the silicon MOSFET. |
地址 |
Eindhoven NL |