| 摘要 |
PROBLEM TO BE SOLVED: To shorten a time required for a voltage stress acceleration test between complementary internal data lines. SOLUTION: Operation of a column system circuit (6) is controlled so that voltage stress is applied continuously to a complementary internal data line included in the column system circuit (6) at activation of a test mode signal (TM) from a row system control circuit (4) and a control circuit (8). Concretely, a write-driver driving a data line is kept forcedly at a non-activation state, and a sense amplifier is connected to an internal data line. Column selection operation is prohibited, the internal data line is driven forcedly and continuously according to the write-driver, or a voltage setting circuit is connected to the internal data line, and voltage stress of the internal data line is accelerated conforming to the voltage setting circuit of this internal data line at a test. Repeated data write operation is not required, voltage stress between complementary data lines can be applied continuously to the internal data line, a time required for the voltage stress between complementary data lines can be shortened. COPYRIGHT: (C)2003,JPO
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