发明名称 |
APPARATUS FOR MEASURING HORIZONTAL STATE OF CONVEYING DEVICE |
摘要 |
PURPOSE: A horizontal state measuring apparatus is provided to adjust a horizontal state of a plate supporting a semiconductor substrate by using a pair of bubble tube levels and first and second notch marks. CONSTITUTION: A horizontal state measuring apparatus(100) includes a body(102) having a rectangular plate shape. First and second bubble tube levels(104,106) are accommodated in the body(102) in perpendicular to each other. A first notch mark(108) is formed at an upper surface of the body(102) in order to measure a bubble position of the first bubble tube level(104). A second notch mark(110) is formed at one side of the body in order to measure a horizontal state and height of a handler used for resting a semiconductor substrate on a plate provided in a semiconductor processing device. First and second windows are formed on the upper surface of the body(102).
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申请公布号 |
KR20030064563(A) |
申请公布日期 |
2003.08.02 |
申请号 |
KR20020004901 |
申请日期 |
2002.01.28 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
CHAE, SEUNG WON;KIM, HYEONG YONG |
分类号 |
G01C9/24;(IPC1-7):G01C9/24 |
主分类号 |
G01C9/24 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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