发明名称 APPARATUS FOR MEASURING HORIZONTAL STATE OF CONVEYING DEVICE
摘要 PURPOSE: A horizontal state measuring apparatus is provided to adjust a horizontal state of a plate supporting a semiconductor substrate by using a pair of bubble tube levels and first and second notch marks. CONSTITUTION: A horizontal state measuring apparatus(100) includes a body(102) having a rectangular plate shape. First and second bubble tube levels(104,106) are accommodated in the body(102) in perpendicular to each other. A first notch mark(108) is formed at an upper surface of the body(102) in order to measure a bubble position of the first bubble tube level(104). A second notch mark(110) is formed at one side of the body in order to measure a horizontal state and height of a handler used for resting a semiconductor substrate on a plate provided in a semiconductor processing device. First and second windows are formed on the upper surface of the body(102).
申请公布号 KR20030064563(A) 申请公布日期 2003.08.02
申请号 KR20020004901 申请日期 2002.01.28
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHAE, SEUNG WON;KIM, HYEONG YONG
分类号 G01C9/24;(IPC1-7):G01C9/24 主分类号 G01C9/24
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