发明名称 METHOD OF FABRICATING SEMICONDUCTOR DEVICE HAVING CONTACT HOLE
摘要 PURPOSE: A method of fabricating a semiconductor device having a contact hole is provided to prevent junction spiking by forming irregular sidewall metal layers at the sidewalls of a contact hole. CONSTITUTION: A metal layer is formed on a semiconductor substrate having a contact hole(106a). The metal layer comprises a bottom and a sidewall metal layer(107a,107b). The bottom metal layer is formed on the surface of an impurity diffusion layer exposed at the contact hole. The sidewall metal layer is formed on the upper sidewall of the contact hole on a protrusion portion(120) and the upper portion of an interlayer dielectric(105).
申请公布号 KR20030064477(A) 申请公布日期 2003.08.02
申请号 KR20020004786 申请日期 2002.01.28
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHOI, GIL HYEON;LEE, MYEONG BEOM;MUN, GWANG JIN;PARK, HUI SUK;PARK, SEONG GEON
分类号 H01L21/28;(IPC1-7):H01L21/28 主分类号 H01L21/28
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