| 摘要 |
PROBLEM TO BE SOLVED: To test a semiconductor integrated circuit device at an actual specification speed by executing a masking treatment in the case of a cycle in which collation of an expected value is not required. SOLUTION: The semiconductor integrated circuit device is provided with OR gates 3a, 3b in which an output signal from a functional logic part 1 is compared with expected-value signals from bidirectional buffers 2a, 2b to be set in an input mode in a test and which output an agreement or a disagreement of both signals; and an output circuit which outputs an agreement signal when all of both signals agree and a disagreement signal when any one disagrees. In the OR gates 3a, 3b, a result of the agreement or the disagreement is masked when the collation of the output signal from the part 1 with the expected value is not required. COPYRIGHT: (C)2003,JPO
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