| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor memory device which can quickly discriminate defect of read-out data of a test in a wafer test. SOLUTION: In a test mode, a data transmission period can be set shorter than that at the time of normal data read-out operation and a test time of read-out data in a test mode can be shortened by controlling each of latch circuits of N pieces of an output circuit by a latency setting circuit to be operable, and outputting read-out data from a memory array. COPYRIGHT: (C)2003,JPO
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