发明名称 |
Emission spectrometer solid sample composition determination having luminous discharge source creating surface atom/ion plasma and optical collection unit having mechanism limiting collection volume along common focus axis. |
摘要 |
The emission spectrometer has a luminous discharge source creating a plasma of atoms (4) and ions from the surface (5). An optical component (11) collects the luminous radiation. A mechanism measures the distance between the sample external layer (1a) and the exposed surface (6). There is a mechanism (18) limiting the plasma in a limited collection volume (19) on the optical axis of common focus.
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申请公布号 |
FR2843801(A1) |
申请公布日期 |
2004.02.27 |
申请号 |
FR20020010418 |
申请日期 |
2002.08.20 |
申请人 |
JOBIN YVON SAS |
发明人 |
CHAPON PATRICK |
分类号 |
G01N21/67;(IPC1-7):G01N21/67;H01J49/10 |
主分类号 |
G01N21/67 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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