发明名称 Emission spectrometer solid sample composition determination having luminous discharge source creating surface atom/ion plasma and optical collection unit having mechanism limiting collection volume along common focus axis.
摘要 The emission spectrometer has a luminous discharge source creating a plasma of atoms (4) and ions from the surface (5). An optical component (11) collects the luminous radiation. A mechanism measures the distance between the sample external layer (1a) and the exposed surface (6). There is a mechanism (18) limiting the plasma in a limited collection volume (19) on the optical axis of common focus.
申请公布号 FR2843801(A1) 申请公布日期 2004.02.27
申请号 FR20020010418 申请日期 2002.08.20
申请人 JOBIN YVON SAS 发明人 CHAPON PATRICK
分类号 G01N21/67;(IPC1-7):G01N21/67;H01J49/10 主分类号 G01N21/67
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