| 摘要 |
The invention relates to a measurement data processing system (100) comprising: a measurement data server (101) for providing first measurement data (102) having a first error tolerance (110) and second measurement data (104) having a second error tolerance (112), wherein the first error tolerance (110) is less than the second error tolerance (112); a first measurement data capture device (103) for capturing the first measurement data (102), wherein the first measurement data capture device (103) is calibrated for capture of the first measurement data (102) having a first error tolerance (110) and wherein the first measurement data capture device (103) has a first measurement data transmission interface (107) that is designed to transmit the first measurement data (102) and a first piece of calibration information (106) about the calibration of the first measurement data capture device (103) to the measurement data server (101); and a second measurement data capture device (105) for capturing the second measurement data (104), wherein the second measurement data capture device (105) is calibrated for capture of the second measurement data (104) having a second error tolerance (112) and wherein the second measurement data capture device (105) has a second measurement data transmission interface (109) that is designed to transmit the second measurement data (104) and a second piece of calibration information (108) about the calibration of the second measurement data capture device (105) to the measurement data server (101), wherein the measurement data server (101) has a measurement data capture interface (111) that is designed to receive the first measurement data (102) and the first calibration information (106) from the first measurement data capture device (103), and to receive the second measurement data (104) and the second calibration information (108) from the second measurement data capture device (105), wherein the measurement data server (101) is further designed to provide the first measurement data (102) and the second measurement data (104) in reference to the first calibration information (106) and the second calibration information (108) of the relevant measurement data capture devices (103, 105). |
