发明名称 SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To improve the reliability of flip-chip connection by securing the sinking of an electrode of a wiring board with a light load. SOLUTION: A plurality of connection terminals 3c of a separate board 3 are each composed of a pair of electrode bodies 3d arranged on each side of a space 3e interposed between the electrode bodies 3d. The flip-chip connection is carried out by the use of the separate board 3 in the assembling operation of a semiconductor device. By this setup, when the flip-chip connection is made, a gold bump 1d is brought into contact with ends of the electrode bodies 3d to press them down, so that the electrode bodies 3d kept in a cantilevered state can be easily deformed by a light load. Therefore, the desired sinking of the connection terminal 3c can be secured with a light load, and the flip-chip connection can be improved in connection reliability. COPYRIGHT: (C)2004,JPO
申请公布号 JP2004134497(A) 申请公布日期 2004.04.30
申请号 JP20020295987 申请日期 2002.10.09
申请人 RENESAS TECHNOLOGY CORP;RENASAS NORTHERN JAPAN SEMICONDUCTOR INC 发明人 SAITO YOSHIKI
分类号 H01L23/12;H01L21/60;(IPC1-7):H01L21/60 主分类号 H01L23/12
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