| 摘要 |
FIELD: radio measurements of parameters of absorbing dielectric materials at superhigh frequencies, in particular, measurement of complex relative dielectric permittivity of composite materials, type carboplastics, featured by high values of complex relative dielectric permittivity, having a rough surface. ^ SUBSTANCE: the method and the device for measurements of high values of complex dielectric permittivity of impedance material with a rough surface are claimed. ^ A standard short-circuiting switch and two additional standard short-circuiting switches (a smooth factor of reflection from the standard short-circuiting switches and from the measured test piece is measured, the complex factors of reflection are specified, and the measurement results are processed with calculation of the values of the complex relative dielectric permittivity. ^ EFFECT: enhanced precision of measurement of the complex dielectric permittivity of composite materials having a rough surface. ^ 3 cl, 4 dwg |
