发明名称 試験体上の欠陥を分類するためのコンピュータに実装された方法およびシステム
摘要 Various computer-implemented methods for classifying defects on a specimen are provided. One method includes assigning individual defects detected on the specimen to defect groups based on one or more characteristics of the individual defects. The method also includes displaying information about the defect groups to a user. In addition, the method includes allowing the user to assign a classification to each of the defect groups. Systems configured to classify defects on a specimen are also provided. One system includes program instructions executable on a processor for assigning individual defects detected on the specimen to defect groups based on one or more characteristics of the individual defects. The system also includes a user interface configured for displaying information about the defect groups to a user and allowing the user to assign a classification to each of the defect groups.
申请公布号 JP6055003(B2) 申请公布日期 2016.12.27
申请号 JP20150036757 申请日期 2015.02.26
申请人 ケーエルエー−テンカー コーポレイション 发明人 テー,チョウ,ヒューク;トレリイ,トマソ;デビット、ドミニク;ユング,チウマン;スコット,マイケル,ゴードン;バラスブラマニアン,ラリタ,エイ;ガオ,リシェング;ハング,トング;ザング,ジアンジン;コワルスキ,マイケル;オークレー,ジョナサン
分类号 H01L21/66;G01N21/956 主分类号 H01L21/66
代理机构 代理人
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