| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a method and a system for diagnosis of abnormalities, which accurately grasps states of a measuring instrument at a low cost, using measurement result signals output from the measuring instrument. <P>SOLUTION: The system for diagnosis of abnormalities 130 is provided with a wavelet transformation section 131, in which the time-series measurement signals output from the measuring instrument 100 are subjected to the wavelet transformation and transformed into wavelet transformation signals, indicative of the relations between time values and frequency values, distributed processing sections 131-1 to 132-n which calculate the first variance value of the wavelet transformed signals being processed, using a prescribed time interval in a first frequency region and a second variance value of the wavelet transformation signals processed using the prescribed time interval in a second frequency region having a period longer than that of the first frequency region, and an abnormality state deciding section 133, which compares the first variance value to the second variance value and decides the state as being abnormal, when the first variance value is larger than the second variance value. <P>COPYRIGHT: (C)2004,JPO&NCIPI</p> |
