发明名称 |
SUBSTRATE DETECTING APPARATUS |
摘要 |
PROBLEM TO BE SOLVED: To provide a substrate detecting apparatus of a simple construction, which detects substrates of different dimension without replacing an equipment even if the dimensions of the substrates which are to be detected are different. SOLUTION: The substrate detecting apparatus comprises: a plurality of transmission type sensors 12 which detect a substrate of different size; a plurality of pairs of sensor support means 15 that support the plurality of transmission type sensors 12 so that it can be inserted in the gap between a substrate W and a substrate housing vessel; and an advancing/retreating means 10 and a vertical movement means 9 of the sensor support means 15. The plurality of pairs of sensor support means 15 are arranged dispersedly in the widthwise direction of an opening of the substrate housing vessel. A sensor support means 17 for supporting a transmission type sensor 14 that detects a substrate of large diameter is arranged farther outside in the widthwise direction of the opening while farther protruding toward the substrate housing vessel side. The advancing/retreating means 10 is so controlled that the sensor support means 15 for supporting the transmission type sensor 12 that detects the substrate W is located at a prescribed position according to the substrate W of different size. COPYRIGHT: (C)2004,JPO&NCIPI |
申请公布号 |
JP2004207507(A) |
申请公布日期 |
2004.07.22 |
申请号 |
JP20020375157 |
申请日期 |
2002.12.25 |
申请人 |
SHINKO ELECTRIC CO LTD |
发明人 |
KITAZAWA YASUYOSHI;INOUE MASATOSHI |
分类号 |
H01L21/67;H01L21/68;(IPC1-7):H01L21/68 |
主分类号 |
H01L21/67 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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