发明名称 IMAGE EVALUATION DEVICE
摘要 <p><P>PROBLEM TO BE SOLVED: To provide an image evaluation device that can evaluate a super-resolution image of increased resolution provided by super-resolution processing. <P>SOLUTION: A judgment matrix generation part 5 refers to scattering point information on scattering points on a super-resolution image subjected to super-resolution processing and scattering point information on scattering points on a correct image corresponding to the super-resolution image, to generate, for every cluster, a scattering point judgment matrix showing probabilities of matching of the scattering points on the super-resolution image with the scattering points on the correct image. From the scattering point judgment matrix, a scattering point correlation matrix showing correlations between the scattering points is generated for every cluster. An evaluation value is computed about the scattering point correlation matrix. <P>COPYRIGHT: (C)2004,JPO&NCIPI</p>
申请公布号 JP2004246704(A) 申请公布日期 2004.09.02
申请号 JP20030037085 申请日期 2003.02.14
申请人 MITSUBISHI ELECTRIC CORP 发明人 IZUMI HIDEYUKI
分类号 G06T1/00;G01S7/292;G01S13/90;G06T7/00;(IPC1-7):G06T7/00 主分类号 G06T1/00
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