发明名称 SEMICONDUCTOR DEVICE TO IMPROVE DRIVING ABILITY IN UNIT AREA
摘要 <p>PURPOSE: A semiconductor device is provided to improve driving ability in a unit area by using a method except a minimal machining method for increasing the depth of a roughness part of a semiconductor device. CONSTITUTION: A concave part(6) installed in the length direction of a channel for linearly connecting a high density region is formed in a plurality of channel width directions on the surface part of a semiconductor substrate between two source/drain regions(1) separately formed in the surface of the semiconductor substrate. An insulation layer is formed on the surface part including the concave part between the source/drain regions. A gate electrode is formed on the insulation layer.</p>
申请公布号 KR20040090485(A) 申请公布日期 2004.10.25
申请号 KR20040025761 申请日期 2004.04.14
申请人 SEIKO INSTRUMENTS KABUSHIKI KAISHA ALSO TRADING AS SEIKO INSTRUMENTS INC. 发明人 RISAKI TOMOMITSU
分类号 H01L21/8234;H01L21/336;H01L27/088;H01L27/092;H01L29/10;H01L29/423;H01L29/78;(IPC1-7):H01L29/78 主分类号 H01L21/8234
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