发明名称 |
CAPACITOR WITH TUNNEL-TYPE STORAGE NODES AND MANUFACTURING METHOD THEREOF IMPROVING CHARGE RETENTION CAPABILITY |
摘要 |
PURPOSE: A capacitor of a semiconductor device and a method for manufacturing the same are provided to improve charge retention capability without increasing the height of the capacitor by using a tunnel-type storage node. CONSTITUTION: A first storage node(20) is formed on a substrate(10) having a storage node contact plug(18) and a bit line(16) to connect the storage node contact plug. A capacitor oxide layer is formed on the resultant structure. A groove is formed to expose the first storage node by selectively removing the capacitor oxide layer. A tunnel-type second storage node(23) is formed to connect the first storage node through the groove, to isolate with a memory cell unit and to remove the capacitor oxide layer. A dielectric film(24) is formed at inner and outer walls of the second storage node and on the first storage node. A plate electrode(25) is formed on the dielectric film.
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申请公布号 |
KR20040093285(A) |
申请公布日期 |
2004.11.05 |
申请号 |
KR20030027157 |
申请日期 |
2003.04.29 |
申请人 |
MAGNACHIP SEMICONDUCTOR, LTD. |
发明人 |
LEE, SANG HYEON;YANG, GUK SEUNG |
分类号 |
H01L27/108;(IPC1-7):H01L27/108 |
主分类号 |
H01L27/108 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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