发明名称 |
REFLECTIVE MASK BLANK AND REFLECTIVE MASK |
摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a reflective mask blank and a reflective mask of which lowering of reflectivity is insignificant even when etching residue is present and the relation with other layers can be optimized. <P>SOLUTION: A reflective multilayer film 2 for reflecting exposure light and an absorber layer 4 for absorbing exposure light are provided on a substrate 1, and a buffer layer 3 for protecting the reflective multilayer film 2 when the absorber layer 4 is patterned is provided between the reflective multilayer film 2 and the absorber layer 4. The buffer layer 3 has such a complex index of refraction as the absolute value at the imaginary part thereof is small in the vicinity of a region adjacent to the reflective multilayer film 2 as compared with other parts of the buffer layer 3. <P>COPYRIGHT: (C)2005,JPO&NCIPI</p> |
申请公布号 |
JP2004342867(A) |
申请公布日期 |
2004.12.02 |
申请号 |
JP20030138250 |
申请日期 |
2003.05.16 |
申请人 |
HOYA CORP |
发明人 |
HOSOYA MORIO;KINOSHITA TAKESHI;SHIYOUKI TSUTOMU |
分类号 |
G03F1/22;G03F1/24;G03F1/60;H01L21/027;(IPC1-7):H01L21/027;G03F1/14;G03F1/16 |
主分类号 |
G03F1/22 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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