发明名称 WET CLEANING METHOD OF SEMICONDUCTOR WAFER FOR IMPROVING UNIFORMITY OF CLEANING
摘要 PURPOSE: A method is provided to clean uniformly a semiconductor wafer by rotating the wafer in a cleaning solution of a cleaning bath. CONSTITUTION: An aligned semiconductor wafer(100a) is immersed into a cleaning solution of a cleaning bath(200). The immersed wafer is rotated to a predetermined direction in the cleaning bath. At this time, a flat zone(102) of the wafer is opposite to a bottom portion of the cleaning bath. A cleaning process is performed on the wafer for a predetermined period. The cleaned wafer is unloaded from the cleaning bath.
申请公布号 KR20050002532(A) 申请公布日期 2005.01.07
申请号 KR20030043912 申请日期 2003.06.30
申请人 HYNIX SEMICONDUCTOR INC. 发明人 ROH, CHI HYEONG
分类号 H01L21/306;(IPC1-7):H01L21/306 主分类号 H01L21/306
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