发明名称 |
MEMORY MODULE TEST SYSTEM AND MEMORY MODULE EVALUATION SYSTEM WITH TEST HUB FOR TRANSFERRING ADDRESS/COMMAND/DATA PACKET |
摘要 |
PURPOSE: A memory module test system is provided to test the memory module with a hub by having a test hub for transferring address/command/data packet. CONSTITUTION: A memory module test system comprises more than one of memory module(100) having the first hub(100) and plural semiconductor memory devices(ME1-ME8); a memory tester(170) for testing the memory module; the second hub(150) as a test hub mounted between the first hub(100) in the memory module and the memory tester(170), for converting a memory command and a memory data output from the memory tester into a hub packet and transferring the hub packet to the first hub(100), and converting the hub packet from the first hub(100) into a memory data and transferring the memory data to the memory tester(170).
|
申请公布号 |
KR20050013454(A) |
申请公布日期 |
2005.02.04 |
申请号 |
KR20030052111 |
申请日期 |
2003.07.28 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
AHN, YOUNG MAN;SEO, SEUNG JIN;SHIN, SEUNG MAN;SO, BYUNG SE |
分类号 |
G11C29/00;H04L12/413;(IPC1-7):G11C29/00 |
主分类号 |
G11C29/00 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|