发明名称 MEMORY MODULE TEST SYSTEM AND MEMORY MODULE EVALUATION SYSTEM WITH TEST HUB FOR TRANSFERRING ADDRESS/COMMAND/DATA PACKET
摘要 PURPOSE: A memory module test system is provided to test the memory module with a hub by having a test hub for transferring address/command/data packet. CONSTITUTION: A memory module test system comprises more than one of memory module(100) having the first hub(100) and plural semiconductor memory devices(ME1-ME8); a memory tester(170) for testing the memory module; the second hub(150) as a test hub mounted between the first hub(100) in the memory module and the memory tester(170), for converting a memory command and a memory data output from the memory tester into a hub packet and transferring the hub packet to the first hub(100), and converting the hub packet from the first hub(100) into a memory data and transferring the memory data to the memory tester(170).
申请公布号 KR20050013454(A) 申请公布日期 2005.02.04
申请号 KR20030052111 申请日期 2003.07.28
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 AHN, YOUNG MAN;SEO, SEUNG JIN;SHIN, SEUNG MAN;SO, BYUNG SE
分类号 G11C29/00;H04L12/413;(IPC1-7):G11C29/00 主分类号 G11C29/00
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