发明名称 Calibrated custom instrument gauge module and means for assembly
摘要 A custom instrument gauge module is disclosed which replaces the OEM instrument cluster gauges sub-assembly and utilizes the original electronic circuitry for the unique customization of an existing instrument cluster. The custom gauge module is designed and calibrated to replace the original cluster graphics, gauges, and pointers, while maintaining the original cluster circuitry and, optionally, the molded housing. The flexible design and manufacturing of the custom gauge module allows the enhancement of existing instrument panels to have an upgraded appearance and additional functions, while maintaining and using the original cluster complex electronic circuit.
申请公布号 US6854350(B2) 申请公布日期 2005.02.15
申请号 US20030408143 申请日期 2003.04.04
申请人 AYRES CRAIG A. 发明人 AYRES CRAIG A.
分类号 B60K37/02;(IPC1-7):G01D21/00;G01D11/28;B60Q1/00;B60Q1/26 主分类号 B60K37/02
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