发明名称 Method of etching variable depth features in a crystalline substrate
摘要 Disclosed herein is an easy and well-integrated method of etching features to different depths in a crystalline substrate, such as a single-crystal silicon substrate. The method utilizes a specialized masking process and takes advantage of a highly selective etch process. The method provides a system of interconnected, variable depth reservoirs and channels. The plasma used to etch the channels may be designed to provide a sidewall roughness of about 200 nm or less. The resulting structure can be used in various MEMS applications, including biomedical MEMS and MEMS for semiconductor applications.
申请公布号 US6900133(B2) 申请公布日期 2005.05.31
申请号 US20020247467 申请日期 2002.09.18
申请人 APPLIED MATERIALS, INC 发明人 CHINN JEFFREY D.;RATTNER MICHAEL B.;COOPER JAMES A.;GUENTHER ROLF A.
分类号 B81C1/00;H01L21/3065;H01L21/308;(IPC1-7):H01L21/302;H01L21/306 主分类号 B81C1/00
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