| 发明名称 |
METHOD FOR INSPECTING ARRAY BOARD AND METHOD FOR MANUFACTURING ARRAY BOARD |
| 摘要 |
<p>In the case of inspecting an array board, whether a defect exists in the array board is inspected prior to providing a pixel electrode (step (S3)), and after providing the pixel electrode (step (S7)).</p> |
| 申请公布号 |
WO2005083452(A1) |
申请公布日期 |
2005.09.09 |
| 申请号 |
WO2005JP02814 |
申请日期 |
2005.02.22 |
| 申请人 |
TOSHIBA MATSUSHITA DISPLAY TECHNOLOGY CO., LTD.;TOMITA, SATORU |
发明人 |
TOMITA, SATORU |
| 分类号 |
G01R31/00;G02F1/1362;(IPC1-7):G01R31/00 |
主分类号 |
G01R31/00 |
| 代理机构 |
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代理人 |
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| 主权项 |
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| 地址 |
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