发明名称 ANALYTICAL SYSTEM AND METHOD FOR MEASURING AND CONTROLLING A PRODUCTION PROCESS.
摘要 <p>An analytical system for analysing and controlling a shaping process for glass products is described. The analytical system comprises an infrared-sensitive measurement system and a processor communicating therewith, the infrared-sensitive measurement system being equipped to measure infrared radiation originating from hot glass products immediately after the shaping process for the glass products and the processor being equipped to determine a heat distribution in the glass products on the basis of information determined by the measurement system. Because the infrared-sensitive measurement system is sensitive only to radiation in the so-called Near Infra Red (NIR) region, radiation originating from the interior of the glass wall can be measured. This makes novel analytical methods possible with which, inter alia, a distinction can be made between a change in glass wall thickness and a change in temperature.</p>
申请公布号 MXPA05001145(A) 申请公布日期 2005.09.12
申请号 MX2005PA01145 申请日期 2003.07.30
申请人 XPAR VISION B.V. 发明人 DALSTRA, JOOP
分类号 G01N25/18;C03B9/00;G01J5/00;G01J5/48;G01N1/00;G01N33/38 主分类号 G01N25/18
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