发明名称 METHOD AND APPARATUS FOR REDUCTION OF DEFECTS IN WET PROCESSED LAYERS
摘要 The present invention provides a method and apparatus for wet processing of a conductive layer using a degassed process solution such as a degassed electrochemical deposition solution, a degassed electrochemical polishing solution, a degassed electroless deposition solution, and a degassed cleaning solution. The technique includes degassing the process solution before delivering the degassed process solution to a processing unit or degassing the process solution in- situ, within the processing unit.
申请公布号 KR20060007045(A) 申请公布日期 2006.01.23
申请号 KR20057020595 申请日期 2005.10.28
申请人 ASM NUTOOL, INC. 发明人 UZOH CYPRIAN E.;BASOL BULENT M.
分类号 H01L21/302;B24B37/04;B24B57/02;C23C18/16;C25D7/12;C25D21/04;H01L21/288 主分类号 H01L21/302
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