发明名称 VAGINAL BIOMECHANICS ANALYZER
摘要 The present invention includes a device and method for measuring skin elasticity that comprises: a probe with one or more holes, a vacuum source, a pressure sensor, and one or more infrared or optical proximity sensors aligned about the one or more holes, wherein the probe further comprises a raised area surrounding the one or more holes; and a processor for recording the deformation of the skin using a control unit comprising a microcontroller connected to the one or more infrared or optical proximity sensors and the one or more pressure sensors, to measure an amount of skin drawn into and out of the one or more holes to determine the distance between the one or more proximity sensors and the skin both inside and outside the probe.
申请公布号 US2016317078(A1) 申请公布日期 2016.11.03
申请号 US201615210383 申请日期 2016.07.14
申请人 BOARD OF REGENTS, THE UNIVERSITY OF TEXAS SYSTEM 发明人 White Carter B.;Zimmern Philippe;Eberhart Robert C.
分类号 A61B5/00;A61B5/02;A61B5/08;A61B5/20 主分类号 A61B5/00
代理机构 代理人
主权项 1. A device for measuring skin elasticity comprising: a probe, wherein the probe comprises one or more holes, a vacuum source, a pressure sensor, and one or more proximity sensors aligned about the one or more holes, wherein the probe further comprises a raised area surrounding the one or more holes; and a processor for recording the deformation of the skin using a control unit comprising a microcontroller connected to the one or more proximity sensors and the one or more pressure sensors, wherein the proximity sensor is positioned at a pre-determined distance from the skin, wherein a vacuum in the probe is capable of pulling skin into the one or more holes and the proximity sensor is capable of measuring an amount of skin drawn into and out of the one or more holes to determine the distance between the one or more proximity sensors and the skin before, during and after release of the vacuum, and wherein the processor calculates the skin elasticity of the skin based on the distance to the one or more proximity sensors throughout a measurement cycle both inside and outside the probe.
地址 Austin TX US