发明名称 MEASUREMENT DEVICE AND MEASUREMENT METHOD
摘要 An eyeblink measurement system 10 is a measurement apparatus for measuring a subject's eyelid position, and includes a lighting device 1 that irradiates light extending across upper to lower eyelids of the subject's eye region E, and an image measurement device 2 that has an optical axis Ia on a plane for which a plane including an irradiation optical axis La of the light is rotated by a predetermined angle θ around an axis A1 along the light to be irradiated onto the subject, obtains height information based on the position of an optical image of the light in an image imaged, and measures the eyelid position based on the height information.
申请公布号 US2016317033(A1) 申请公布日期 2016.11.03
申请号 US201415105088 申请日期 2014.11.14
申请人 HAMAMATSU PHOTONICS K.K. 发明人 MATSUI Yoshinori;SUZUKI Kazutaka;TOYODA Haruyoshi;TAKUMI Munenori;HAKAMATA Naotoshi
分类号 A61B3/14;H04N5/225;G06T7/00;A61B3/00 主分类号 A61B3/14
代理机构 代理人
主权项 1. A measurement apparatus for measuring a subject's eyelid position, comprising: a lighting device configured to irradiate light extending across the subject's upper to lower eyelids; an imaging device having an optical axis on a plane for which a plane including an optical axis of the light is rotated by a predetermined angle around an axis along the light to be irradiated onto the subject; and an arithmetic device configured to obtain height information based on a position of an optical image in an image imaged by the imaging device, and measures the eyelid position based on the height information.
地址 Hamamatsu-shi, Shizuoka JP