发明名称 Method of forming semiconductor device having a conductive via structure
摘要 A method for fabricating a semiconductor device includes forming a first photo-sensitive layer over a contact pad, wherein the contact pad is on a substrate. The method further includes patterning the first photo-sensitive layer to form a first opening over a portion of the contact pad. The method further includes plating a conductive via in the first opening; and removing the first photo-sensitive layer. The method further includes forming a passivation layer over the substrate, contact pad, and conductive via, and exposing the conductive via by grinding the passivation layer. The method further includes forming a second photo-sensitive layer over the conductive via and passivation layer. The method further includes patterning the second photo-sensitive layer to form a second opening larger than and completely exposing the conductive via. The method further includes plating a conductive pillar in the second opening; and removing the second photo-sensitive layer.
申请公布号 US9514978(B2) 申请公布日期 2016.12.06
申请号 US201514857954 申请日期 2015.09.18
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 Chang Kuo-Chin;Shieh Yuh Chern
分类号 H01L21/768;H01L23/528;H01L23/31;H01L23/00 主分类号 H01L21/768
代理机构 Hauptman Ham, LLP 代理人 Hauptman Ham, LLP
主权项 1. A method of fabricating a semiconductor device, comprising the steps of: forming a first photo-sensitive layer over a contact pad, wherein the contact pad is on a substrate; patterning the first photo-sensitive layer to form a first opening over a portion of the contact pad; plating a conductive via in the first opening; removing the first photo-sensitive layer; forming a passivation layer over the substrate, contact pad, and conductive via, and exposing the conductive via by grinding the passivation layer; forming a second photo-sensitive layer over the conductive via and passivation layer; patterning the second photo-sensitive layer to form a second opening larger than and completely exposing the conductive via; plating a conductive pillar in the second opening; and removing the second photo-sensitive layer.
地址 TW