发明名称 |
Method of forming semiconductor device having a conductive via structure |
摘要 |
A method for fabricating a semiconductor device includes forming a first photo-sensitive layer over a contact pad, wherein the contact pad is on a substrate. The method further includes patterning the first photo-sensitive layer to form a first opening over a portion of the contact pad. The method further includes plating a conductive via in the first opening; and removing the first photo-sensitive layer. The method further includes forming a passivation layer over the substrate, contact pad, and conductive via, and exposing the conductive via by grinding the passivation layer. The method further includes forming a second photo-sensitive layer over the conductive via and passivation layer. The method further includes patterning the second photo-sensitive layer to form a second opening larger than and completely exposing the conductive via. The method further includes plating a conductive pillar in the second opening; and removing the second photo-sensitive layer. |
申请公布号 |
US9514978(B2) |
申请公布日期 |
2016.12.06 |
申请号 |
US201514857954 |
申请日期 |
2015.09.18 |
申请人 |
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. |
发明人 |
Chang Kuo-Chin;Shieh Yuh Chern |
分类号 |
H01L21/768;H01L23/528;H01L23/31;H01L23/00 |
主分类号 |
H01L21/768 |
代理机构 |
Hauptman Ham, LLP |
代理人 |
Hauptman Ham, LLP |
主权项 |
1. A method of fabricating a semiconductor device, comprising the steps of:
forming a first photo-sensitive layer over a contact pad, wherein the contact pad is on a substrate; patterning the first photo-sensitive layer to form a first opening over a portion of the contact pad; plating a conductive via in the first opening; removing the first photo-sensitive layer; forming a passivation layer over the substrate, contact pad, and conductive via, and exposing the conductive via by grinding the passivation layer; forming a second photo-sensitive layer over the conductive via and passivation layer; patterning the second photo-sensitive layer to form a second opening larger than and completely exposing the conductive via; plating a conductive pillar in the second opening; and removing the second photo-sensitive layer. |
地址 |
TW |