发明名称 Peroxide-vapor treatment for enhancing photoresist-strip performance and modifying organic films
摘要 Methods and apparatus for treating an organic film such as photoresist with a hydroxyl-generating compound prior to removing the organic film from a substrate are provided. Treatments include exposure to one or more of hydrogen peroxide vapor and water vapor in a non-plasma environment. In some implementations, conditions are such that condensation on the surface is suppressed. Methods include treating high-dose ion-implantation photoresists and post-plasma doping photoresists with little or no material loss and permit mild plasma removal of the photoresist after treatment.
申请公布号 US9514954(B2) 申请公布日期 2016.12.06
申请号 US201414301155 申请日期 2014.06.10
申请人 Lam Research Corporation 发明人 Thedjoisworo Bayu Atmaja;Jacobs Bradley Jon;Berry Ivan;Cheung David
分类号 H01L21/311;H01L21/67 主分类号 H01L21/311
代理机构 Weaver Austin Villeneuve & Sampson LLP 代理人 Weaver Austin Villeneuve & Sampson LLP
主权项 1. A method of removing an organic film from a substrate, comprising: exposing the organic film to hydrogen peroxide vapor to modify the organic film under non-plasma conditions at a chamber pressure between 0.6 Torr and 760 Torr; and after exposing the organic film to the hydrogen peroxide vapor, exposing the organic film to a plasma to remove the organic film.
地址 Fremont CA US