发明名称 |
Peroxide-vapor treatment for enhancing photoresist-strip performance and modifying organic films |
摘要 |
Methods and apparatus for treating an organic film such as photoresist with a hydroxyl-generating compound prior to removing the organic film from a substrate are provided. Treatments include exposure to one or more of hydrogen peroxide vapor and water vapor in a non-plasma environment. In some implementations, conditions are such that condensation on the surface is suppressed. Methods include treating high-dose ion-implantation photoresists and post-plasma doping photoresists with little or no material loss and permit mild plasma removal of the photoresist after treatment. |
申请公布号 |
US9514954(B2) |
申请公布日期 |
2016.12.06 |
申请号 |
US201414301155 |
申请日期 |
2014.06.10 |
申请人 |
Lam Research Corporation |
发明人 |
Thedjoisworo Bayu Atmaja;Jacobs Bradley Jon;Berry Ivan;Cheung David |
分类号 |
H01L21/311;H01L21/67 |
主分类号 |
H01L21/311 |
代理机构 |
Weaver Austin Villeneuve & Sampson LLP |
代理人 |
Weaver Austin Villeneuve & Sampson LLP |
主权项 |
1. A method of removing an organic film from a substrate, comprising:
exposing the organic film to hydrogen peroxide vapor to modify the organic film under non-plasma conditions at a chamber pressure between 0.6 Torr and 760 Torr; and after exposing the organic film to the hydrogen peroxide vapor, exposing the organic film to a plasma to remove the organic film. |
地址 |
Fremont CA US |