| 发明名称 | System and method using OAM spectroscopy leveraging fractional orbital angular momentum as signature to detect materials | ||
| 摘要 | An apparatus that detects a material within a sample includes signal generation circuitry that generates a first signal having at least one orbital angular momentum applied thereto and applies the first signal to the sample. A detector receives the first signal after the first signal passes through the sample and detects the material responsive to a detection of a predetermined profile of orbital angular momentum states within the first signal received from the sample. | ||
| 申请公布号 | US9500586(B2) | 申请公布日期 | 2016.11.22 |
| 申请号 | US201514842330 | 申请日期 | 2015.09.01 |
| 申请人 | NXGEN PARTNERS IP, LLC | 发明人 | Ashrafi Solyman;Linquist Roger |
| 分类号 | G01N21/59;G01N24/00;G01R33/36;G01N21/17 | 主分类号 | G01N21/59 |
| 代理机构 | Howison & Arnott, L.L.P. | 代理人 | Howison & Arnott, L.L.P. |
| 主权项 | 1. An apparatus that detects a material within a sample, comprising: signal generation circuitry that generates a first signal having at least one orbital angular momentum applied thereto and applies the first signal to the sample; a detector for receiving the first signal after the first signal passes through the sample and detecting the material responsive to a detection of a predetermined profile of orbital angular momentum states within the first signal received from the sample. | ||
| 地址 | Dallas TX US | ||