发明名称 TEXTILE PATTERNING FOR SUBTRACTIVELY-PATTERNED SELF-ALIGNED INTERCONNECTS, PLUGS, AND VIAS
摘要 Embodiments of the invention include methods of forming a textile patterned hardmask. In an embodiment, a first hardmask and a second hardmask are formed over a top surface of an interconnect layer in an alternating pattern. A sacrificial cross-grating may then be formed over the first and second hardmaskS. In an embodiment, portions of the first hardmask that are not covered by the sacrificial cross-grating are removed to form first openings and a third hardmask is disposed into the first openings. Embodiments may then include etching through portions of the second hardmask that are not covered by the sacrificial cross-grating to form second openings. The second openings may be filled with a fourth hardmask. According to an embodiment, the first, second, third, and fourth hardmasks are etch selective to each other. In an embodiment the sacrificial cross-grating may then be removed.
申请公布号 WO2016209293(A1) 申请公布日期 2016.12.29
申请号 WO2015US38145 申请日期 2015.06.26
申请人 INTEL CORPORATION;LIN, Kevin;BRISTOL, Robert Lindsey;MYERS, Alan M. 发明人 LIN, Kevin;BRISTOL, Robert Lindsey;MYERS, Alan M.
分类号 H01L21/027 主分类号 H01L21/027
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