发明名称 Nonvolatile memory device and method for sensing the same
摘要 A nonvolatile memory device includes a first resistive memory cell connected to a first word line, a second resistive memory cell connected to a second word line that is different from the first word line, a clamping unit connected between a sensing node and the first resistive memory cell to provide a clamping bias to the first resistive memory cell, a reference current supplying unit connected to the second resistive memory cell to supply a reference current, and a sense amplifier connected to the sensing node to sense a level change of the sensing node, wherein when the first word line is enabled, the second word line is disabled.
申请公布号 US9478302(B2) 申请公布日期 2016.10.25
申请号 US201514687409 申请日期 2015.04.15
申请人 Samsung Electronics Co., Ltd. 发明人 Park Mu-Hui
分类号 G11C7/00;G11C16/28;G11C7/06;G11C11/16;G11C11/56;G11C13/00;G11C11/22 主分类号 G11C7/00
代理机构 Volentine & Whitt, PLLC 代理人 Volentine & Whitt, PLLC
主权项 1. A nonvolatile memory device comprising: a first resistive memory cell connected to a first word line; a second resistive memory cell connected to a second word line that is different from the first word line; a clamping unit connected between a sensing node and the first resistive memory cell and configured to provide a clamping bias to the first resistive memory cell; a reference current supplying unit connected to the second resistive memory cell and configured to supply a reference current to the second resistive memory cell; a sense amplifier connected to the sensing node, the sense amplifier being configured to sense a level change of the sensing node; a controller configured to perform a sensing operation such that when the first word line is enabled, the second word line is disabled; and a precharge voltage supplying unit configured to supply a precharge voltage to the first resistive memory cell, wherein the precharge voltage comprises a first precharge voltage and a second precharge voltage, and wherein a time required to provide the second precharge voltage to the first resistive memory cell is longer than a time required to provide the first precharge voltage to the first resistive memory cell.
地址 Suwon-si, Gyeonggi-do KR