METHOD AND CIRCUIT FOR THE SELECTIVE MEASUREMENT OF THE WIDE BAND LEVEL OF A MEASURED SIGNAL,申请号GB19770028541-传众专利搜索

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发明名称	METHOD AND CIRCUIT FOR THE SELECTIVE MEASUREMENT OF THE WIDE BAND LEVEL OF A MEASURED SIGNAL
摘要
申请公布号	GB1549567(A)	申请公布日期	1979.08.08
申请号	GB19770028541	申请日期	1977.07.07
申请人	WANDEL & GOLTERMANN GMBH	发明人
分类号	G01R17/04;G01R19/00;G01R23/00;(IPC1-7):G01R19/00	主分类号	G01R17/04
代理机构		代理人
主权项
地址

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