发明名称 Hierarchical determination of metrics for component-based parameterized SoCs
摘要 A method of determining a metric of a System-on-Chip (SoC), the method comprising: receiving a model dependency graph representing the SoC, the model dependency graph having a plurality of nodes representing components of the SoC and their models, and a plurality of directed edges between the nodes representing variables passed between the nodes of the model dependency graph; modifying the model dependency graph by clustering a plurality of strongly connected nodes in the model dependency graph into a single clustered node to form a clustered model dependency graph; determining an execution schedule according to a direction of an edge in the clustered model dependency graph; and executing models in the clustered model dependency graph according to the execution schedule to determine metrics of the SoC.
申请公布号 US9477799(B2) 申请公布日期 2016.10.25
申请号 US201414554813 申请日期 2014.11.26
申请人 CANON KABUSHIKI KAISHA 发明人 Yachide Yusuke;Javaid Haris;Parameswaran Sridevan
分类号 G06F17/50;G06F9/455 主分类号 G06F17/50
代理机构 Canon USA, Inc. IP Division 代理人 Canon USA, Inc. IP Division
主权项 1. A method of determining a metric of a system-on-chip (SoC), the method comprising: receiving a model dependency graph representing the SoC, the model dependency graph having a plurality of nodes representing components of the SoC and their models, and a plurality of directed edges between the nodes representing variables passed between the nodes of the model dependency graph; modifying the model dependency graph by clustering a plurality of strongly connected nodes in the model dependency graph into a single clustered node to form a clustered model dependency graph; determining an execution schedule according to a direction of an edge in the clustered model dependency graph; and executing models in the clustered model dependency graph according to the execution schedule to determine metrics of the SoC.
地址 Tokyo JP