发明名称 |
Hierarchical determination of metrics for component-based parameterized SoCs |
摘要 |
A method of determining a metric of a System-on-Chip (SoC), the method comprising: receiving a model dependency graph representing the SoC, the model dependency graph having a plurality of nodes representing components of the SoC and their models, and a plurality of directed edges between the nodes representing variables passed between the nodes of the model dependency graph; modifying the model dependency graph by clustering a plurality of strongly connected nodes in the model dependency graph into a single clustered node to form a clustered model dependency graph; determining an execution schedule according to a direction of an edge in the clustered model dependency graph; and executing models in the clustered model dependency graph according to the execution schedule to determine metrics of the SoC. |
申请公布号 |
US9477799(B2) |
申请公布日期 |
2016.10.25 |
申请号 |
US201414554813 |
申请日期 |
2014.11.26 |
申请人 |
CANON KABUSHIKI KAISHA |
发明人 |
Yachide Yusuke;Javaid Haris;Parameswaran Sridevan |
分类号 |
G06F17/50;G06F9/455 |
主分类号 |
G06F17/50 |
代理机构 |
Canon USA, Inc. IP Division |
代理人 |
Canon USA, Inc. IP Division |
主权项 |
1. A method of determining a metric of a system-on-chip (SoC), the method comprising:
receiving a model dependency graph representing the SoC, the model dependency graph having a plurality of nodes representing components of the SoC and their models, and a plurality of directed edges between the nodes representing variables passed between the nodes of the model dependency graph; modifying the model dependency graph by clustering a plurality of strongly connected nodes in the model dependency graph into a single clustered node to form a clustered model dependency graph; determining an execution schedule according to a direction of an edge in the clustered model dependency graph; and executing models in the clustered model dependency graph according to the execution schedule to determine metrics of the SoC. |
地址 |
Tokyo JP |