发明名称 Polarization analysis apparatus
摘要 Provided is a polarization analysis apparatus that can quickly measure the polarization properties of a sample. The polarization analysis apparatus includes a light source configured to emit light in a predetermined wavelength region, a polarizer configured to transmit the light emitted from the light source, a spatial phase modulator configured to transmit the light from the sample, an analyzer configured to transmit the light that has passed through the spatial phase modulator, and an imaging spectrometer configured to receive the light that has passed through the analyzer. The spatial phase modulator is formed of a birefringent material, and is configured to have different phase differences at respective positions in a first direction in a plane orthogonal to an optical axis. The imaging spectrometer disperses the received light in a second direction that is different from the first direction in the plane orthogonal to the optical axis.
申请公布号 US9488568(B2) 申请公布日期 2016.11.08
申请号 US201414568122 申请日期 2014.12.12
申请人 Otsuka Electronics Co., Ltd. 发明人 Sugita Kazuhiro;Yamazaki Yusuke;Otsuka Haruka
分类号 G01N21/21 主分类号 G01N21/21
代理机构 Hubbs, Enatsky & Inoue PLLC 代理人 Hubbs, Enatsky & Inoue PLLC
主权项 1. A polarization analysis apparatus, comprising: a light source configured to emit light in a predetermined wavelength region; a polarizer configured to transmit the light emitted from the light source, the light having passed through the polarizer being radiated on a sample; a spatial phase modulator configured to transmit the light from the sample, the spatial phase modulator being formed of a birefringent material and being configured to have different phase differences at respective positions in a first direction in a plane orthogonal to an optical axis; an analyzer configured to transmit the light that has passed through the spatial phase modulator; an imaging spectrometer configured to receive the light that has passed through the analyzer, and disperse the received light in a second direction that is different from the first direction in the plane orthogonal to the optical axis, and wherein the spatial phase modulator comprises two regions that are adjacent in the first direction, the two regions having different directions in one of a fast axis and a slow axis.
地址 Osaka JP