发明名称 TESTING METHOD FOR HYBRID INTEGRATED CIRCUIT
摘要 PURPOSE:To replace defective parts of a hybrid integrated circuit before a metallic case is bonded, by performing the burn-in operation of the hybrid integrated circuit in protective box wherein inert gas is sealed, and extracting defection in an early stage. CONSTITUTION:On the center projecting part 10' of a protective box body 10, the metallic stem 1 of a hybrid integrated circuit is held. This body 10 is provided with a suction pipe 15 and a suction pipe 16 and in the protective box wherein inert gas is sealed, the hybrid integrated circuit is burned in through an airtight terminal 14, a connector 13, etc. to test its characteristics, thus extracting defective in an early stage. Therefore, before a metallic case 4 is bonded, parts such as defective active element 3 are replaced, generating the hybrid integrated circuit efficiently.
申请公布号 JPS57149973(A) 申请公布日期 1982.09.16
申请号 JP19810035056 申请日期 1981.03.11
申请人 FUJITSU KK 发明人 YABE NORIO;TAKAHARA TOSHIO
分类号 G01R31/26;G01R31/28;G01R31/30 主分类号 G01R31/26
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