| 摘要 |
PURPOSE:To automate probe application test for chip pins by providing IC chip pin output observation board on which a bus cable is attached and a multiplexer the connects any of a plurality of lead wires for a cable to a data resistor. CONSTITUTION:One of LSI chip boards, 11, 12-1N, for instance, 1N is taken as an observation board. A bus cable 30 is extended from this and a free terminal is joined to the LSI chip 20 of one chipboard. The other end of the bus cable 30 is connected to the level conversion circuit 50 of the observation board 1N. Output voltage to which level conversion is applied is selected based on the output of an address register 54 operated by the input of a service processor SVP at a multiplexer 52. The selected signal is led to a data registor 56, and its output is returned to the service processor SVP. Accordingly, all necessary tests can be carried out automatically by storing required test programs in this processor. |
